電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)擊(ji)穿(chuan)測(ce)(ce)試(shi)儀是一種用(yong)于測(ce)(ce)定(ding)固體(ti)、液體(ti)或(huo)氣(qi)體(ti)絕(jue)緣材料耐(nai)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)強度(du)的(de)專用(yong)設(she)(she)備(bei)，其核(he)心原理是通過(guo)可控高(gao)(gao)(gao)壓(ya)(ya)(ya)輸(shu)出(chu)與實時(shi)(shi)監(jian)測(ce)(ce)技術，模(mo)擬(ni)材料在實際應(ying)用(yong)中的(de)電(dian)(dian)(dian)(dian)場(chang)(chang)環境。設(she)(she)備(bei)工作時(shi)(shi)，高(gao)(gao)(gao)壓(ya)(ya)(ya)發(fa)生(sheng)器通過(guo)升(sheng)壓(ya)(ya)(ya)電(dian)(dian)(dian)(dian)路生(sheng)成(cheng)可調(diao)直流(liu)(liu)(liu)或(huo)交流(liu)(liu)(liu)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，經保(bao)(bao)護(hu)電(dian)(dian)(dian)(dian)阻后加(jia)載到平(ping)行板電(dian)(dian)(dian)(dian)極或(huo)特定(ding)形狀的(de)測(ce)(ce)試(shi)電(dian)(dian)(dian)(dian)極上，電(dian)(dian)(dian)(dian)極間夾持被測(ce)(ce)樣品。控制系統(tong)按照預設(she)(she)程序(xu)（如(ru)梯度(du)升(sheng)壓(ya)(ya)(ya)、連續升(sheng)壓(ya)(ya)(ya)）逐步增加(jia)輸(shu)出(chu)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，同時(shi)(shi)高(gao)(gao)(gao)精度(du)傳感(gan)器同步采集回路電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)、電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)波形及(ji)介質泄漏電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)數據。當(dang)材料內(nei)部電(dian)(dian)(dian)(dian)場(chang)(chang)強度(du)超過(guo)其介電(dian)(dian)(dian)(dian)極，絕(jue)緣結構發(fa)生(sheng)不(bu)可逆擊(ji)穿(chuan)，此時(shi)(shi)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)監(jian)測(ce)(ce)模(mo)塊會檢測(ce)(ce)到電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)值的(de)突(tu)變，光學傳感(gan)器或(huo)聲波探頭可輔助識(shi)別擊(ji)穿(chuan)瞬間產生(sheng)的(de)電(dian)(dian)(dian)(dian)弧(hu)或(huo)放電(dian)(dian)(dian)(dian)現象。系統(tong)立即切斷高(gao)(gao)(gao)壓(ya)(ya)(ya)輸(shu)出(chu)并記錄擊(ji)穿(chuan)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)值，結合樣品厚(hou)度(du)自動計算擊(ji)穿(chuan)場(chang)(chang)強。為確(que)保(bao)(bao)安全，設(she)(she)備(bei)集成(cheng)多(duo)重(zhong)保(bao)(bao)護(hu)機制，包括過(guo)流(liu)(liu)(liu)保(bao)(bao)護(hu)、電(dian)(dian)(dian)(dian)弧(hu)抑制及(ji)緊急斷電(dian)(dian)(dian)(dian)裝(zhuang)置，同時(shi)(shi)配(pei)備(bei)環境溫濕度(du)監(jian)控模(mo)塊，保(bao)(bao)障測(ce)(ce)試(shi)條件符合IEC 60243等國際標準(zhun)要(yao)求。測(ce)試結果(guo)可為材料選型(xing)、絕(jue)緣設計及質(zhi)量控制提(ti)供關鍵參數支持。